2070xCFSpin High CurrentAmount of surge current used to spin up the drive.

2080xD0Spin BuzzCount of buzz routines needed to spin up the drive due to insufficient power.

2090xD1Offline Seek PerformanceDrive’s seek performance during its internal tests.

2100xD2Unkonw(found in a Maxtor 6B200M0 200GB and Maxtor 2R015H1 15GB disks)

2110xD3Vibration During WriteVibration During Write

2120xD4Shock During WriteShock During Write

2200xDCDisk ShiftDistance the disk has shifted relative to the spindle (usually due to shock or temperature). Unit of measure is unknown.

2220xDELoaded HoursTime spent operating under data load (movement of magnetic head armature)

2230xDFLoad/Unload Retry CountCount of times head changes position.

2240xE0Load FrictionResistance caused by friction in mechanical parts while operating.

2250xE1Load/Unload Cycle CountTotal count of load cycles

2260xE2Load 'In'-timeTotal time of loading on the magnetic heads actuator (time not spent in parking area).

2270xE3Torque Amplification CountCount of attempts to compensate for platter speed variations

2280xE4Power-Off Retract CycleThe count of times the magnetic armature was retracted automatically as a result of cutting power.

2300xE6GMR Head AmplitudeAmplitude of thrashing (distance of repetitive forward/reverse head motion)

2310xE7TemperatureDrive Temperature

2320xE8Endurance RemainingNumber of physical erase cycles completed on the drive as a percentage of the maximum physical erase cycles the drive is designed to endure

2320xE8Available Reserved SpaceIntel SSD reports the number of available reserved space as a percentage of reserved space in a brand new SSD.

2330xE9Power-On HoursNumber of hours elapsed in the power-on state.

2330xE9Media Wearout IndicatorIntel SSD reports a normalized value of 100 (when the SSD is new) and declines to a minimum value of 1. It decreases while the NAND erase cycles increase from 0 to the maximum-rated cycles.

2400xF0Head Flying HoursTime while head is positioning

2400xF0Transfer Error Rate(Fujitsu)Count of times the link is reset during a data transfer.

2410xF1Total LBAs WrittenTotal count of LBAs written

2420xF2Total LBAs ReadTotal count of LBAs read.

Some S.M.A.R.T. utilities will report a negative number for the raw value since in reality it has 48 bits rather than 32.

2500xFARead Error Retry RateCount of errors while reading from a disk

2540xFEFree Fall Protectionount of Free Fall Events detected

3.5 SMART self-test

使用smartctl –t offline/short/long 可以指定磁盤進(jìn)行自測。

offline：

這個(gè)是默認(rèn)的自測。

short：

短時(shí)自測的目的是快速確認(rèn)磁盤是否故障。

測試過程有很多項(xiàng)目，都是磁盤廠商自定義的，比如下面的項(xiàng)目：

a) 電氣測試項(xiàng)目，測試磁盤內(nèi)部的電路。具體測試細(xì)節(jié)有磁盤廠商自己指定，比如：

A) 緩存測試。

B) 讀、寫電路測試。

C) 讀、寫磁頭測試。

b) 尋道、伺服測試項(xiàng)目，測試磁盤在數(shù)據(jù)磁道上的尋找和伺服能。

c) 讀、校驗(yàn)測試項(xiàng)目，測試磁盤對部分或全盤的讀能力。

long：

稱為擴(kuò)展的自測試。測試的項(xiàng)目和short類型，但是時(shí)間長得多。